A novel ATR-FTIR method for functionalised surface characterisationANDERSSON, Per Ola; LIND, Per; MATTSSON, Andreas et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 623-626, issn 0142-2421, 4 p.Conference Paper

A resonant photoelectron spectroscopy study of Sn(O_x) doped CeO₂ catalystsMATOLIN, V; CABALA, M; CHKB, V et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 225-230, issn 0142-2421, 6 p.Conference Paper

Actual constitution of the mixed oxide promoter in a Rh/Ce_1-xPr_xO_2-y/Al₂O₃ catalyst. Evolution throughout the preparation stepsABOUSSAÏD, Karima; BERNAL, Serafin; BLANCO, Ginesa et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 242-245, issn 0142-2421, 4 p.Conference Paper

Analysis of the oil-water interface byXPS at low temperatureGENET, M. J; COGELS, P; ADRIAENSEN, Y et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 338-342, issn 0142-2421, 5 p.Conference Paper

Behaviour of T16A14V implant alloy in vitro after plastic deformation by bendingKIERZKOWSKA, Agnieszka; KRASICKA-CYDZIK, Elzbieta.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 507-512, issn 0142-2421, 6 p.Conference Paper

Ce 3d XPS investigation of cerium oxides and mixed cerium oxide (Ce_xTi_yO_z)BECHE, Eric; CHARVIN, Patrice; PERARNAU, Danielle et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 264-267, issn 0142-2421, 4 p.Conference Paper

Cleaning of albumin-contaminated Ti and Cr surfaces : an XPS and QCM studyPAYET, Vincent; BRUNNER, Susanne; GALTAYRIES, Anouk et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 215-219, issn 0142-2421, 5 p.Conference Paper

Combined XPS, SIMS, and AFM analyses of silicon nanocrystals embedded in silicon oxide layersVANZETTI, L; BAROZZI, M; IACOB, E et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 543-546, issn 0142-2421, 4 p.Conference Paper

Comparison between XPS-and FTIR-analysis of plasma-treated polypropylene film surfacesMORENT, R; DE GEYTER, N; LEYS, C et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 597-600, issn 0142-2421, 4 p.Conference Paper

Influence of different primary ion species on the secondary ion emission from PNA/DNA biosensor surfacesHELLWEG, Sebastian; HEILE, Andreas; GREHL, Thomas et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 198-201, issn 0142-2421, 4 p.Conference Paper

Influence of polyvinylpyrolidone as an additive in electrochemical preparation of ZnO nanowires and nanostructured thin filmsENCULESCU, Ionut; MATEI, Elena; SIMA, Mariana et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 556-560, issn 0142-2421, 5 p.Conference Paper

Insulator nanocapillary production from biological sampleBERECZKY, R. J; TÖKESI, K; VARGA, D et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 584-587, issn 0142-2421, 4 p.Conference Paper

Interfacial studies of Al₂O₃ deposited on 4H-SiC(0001)DIPLAS, Spyros; AVICE, Marc; THOGERSEN, Annett et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 822-825, issn 0142-2421, 4 p.Conference Paper

Optical trigger based on the molecules of bacteriorhodopsin adsorbed on AgBr nanocrystalsZAKHAROV, V. N; KUDRYAVTSEV, I. K; ASLANOV, L. A et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 495-497, issn 0142-2421, 3 p.Conference Paper

Plasmon peak inhomogeneous broadening in reflection electron energy loss spectroscopy from carbon materialsCALLIARI, L; FANCHENKO, S; FILIPPI, M et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 814-817, issn 0142-2421, 4 p.Conference Paper

Reactive deposition of TiN_x layers in a DC-magnetron dischargeWREHDE, Stefan; QUAAS, Marion; BOGDANOWICZ, Robert et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 790-793, issn 0142-2421, 4 p.Conference Paper

The application of ITTFA and ARXPS to study the ion beam mixing of metal/Si bilayersPALACIO, C; ARRANZ, A.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 676-682, issn 0142-2421, 7 p.Conference Paper

XPS and TOF-SIMS study of the distribution of Li ions in thin films of vanadium pentoxide after electrochemical intercalationCASTLE, James E; DECKER, Franco; SALVI, Anna Maria et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 746-750, issn 0142-2421, 5 p.Conference Paper

Papers Presented at ECASIA'07. Proceedings of the 12^th European Conference on Applications of surface and Interface Analysis, 9-14 September 2007, Brussels, BelgiumPIREAUX, Jean-Jacques; WATTS, John F.Surface and interface analysis. 2008, Vol 40, Num 3-4, issn 0142-2421, 782 p.Conference Proceedings

ARXPS study of the ion mobility through (HfO₂)_x(SiO₂)_1-x formed on air-exposed HfSi_0.5As_1.5GROSVENOR, Andrew P; CAVELL, Ronald G; MAR, Arthur et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 490-494, issn 0142-2421, 5 p.Conference Paper

Analysis of Cu segregation to oxide-metal interface of Ni-base alloy by HX-PESDOI, Takashi; KITAMURA, Kazuyuki; NISHIYAMA, Yoshitaka et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 329-333, issn 0142-2421, 5 p.Conference Paper

Calculation of layer thickness on rough surfaces by polyhedral modelMOHAI, M.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 710-713, issn 0142-2421, 4 p.Conference Paper

Characterisation of the silicon nitride thin films deposited by plasma magnetronBATAN, A; FRANQUET, A; VEREECKEN, J et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 754-757, issn 0142-2421, 4 p.Conference Paper

Characterization challenges for nanomaterialsBAER, D. R; AMONETTE, J. E; SEAL, S et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 529-537, issn 0142-2421, 9 p.Conference Paper

Characterization of gold nanoclusters deposited on HOPG by atmospheric plasma treatmentDEMOISSON, Frédéric; RAES, Marc; TERRYN, Herman et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 566-570, issn 0142-2421, 5 p.Conference Paper